Analysis of atomic force microscopy surface images by means of higher-harmonic tip vibrations modes
Title Variant: Creator: Subject and Keywords:images ; microscopes ; thesis
Publisher: Place of publication: Date: Contributor:Smulko, Janusz. Supervisor ; Bielecki, Zbigniew. Reviewer ; Gotszalk, Teodor Paweł. Reviewer
Resource Type: Format: Source: Language: Relation:Gdańsk University of Technology ; Faculty of Electronics, Telecommunications and Informatics
Rights Management: Rights Management:Gdańsk University of Technology Library
Access rights: Localization of the Source: